Keithley Instruments, a provider of advanced electrical test instruments and systems, will broadcast a free, web-based seminar, entitled 'New Methods for Testing Flash Memory' on 20 May 2010.
This one-hour presentation will examine new developments, such as multi-level cell (MLC), that are aimed at achieving increased density.
The webinar will also explore advancements in measurement techniques and capabilities, from characterising a single transistor for development purposes to integrated and automated solutions for Flash production.
During the webinar, the fundamentals of Flash technology testing will be reviewed and there will be a discussion about Fowler-Nordheim (FN) and Hot Electron Injection (HEI) programming and erasing.
Different aspects of testing applicable to single Flash transistors and Flash array testing will be considered, including standard transistor characterisation, endurance and disturb testing.
The pulse fidelity requirement for MLC testing will also be discussed.